Study and Prepared of CuS Thin Films by Ultrasonic Nebulizer Method

Abstract

  Thin Film of copper sulfide with different thickness (100, 200 and 300) nm have been prepared on pre-heated glass substrates up to (330^oC) by Ultrasonic Nebulizer Deposition (UND). The effect of thickness on the structural, optical, and electrical properties of films has been investigated.  The results of the XRD show that the film which deposited with thickness CuS phase with (103) orientation. Atomic force measurement showed the grain size increase with thickness in the range of (76.91-101.32 nm). The optical properties of the films have been studied over a wavelength (370-1100)nm.  The calculated optical energy band gap values were between 2.55 and 2.62eV, depending on the film thickness and in which phase crystallized. The effect of thickness on the electric properties the films have a positive Hall coefficient (p-type), the hall effect increases as thickness increase this due to inversely depend RH  on  carrier concentration.