Effect of the Cd Concentration on the Characteristic Parameters of Znx-1CdxS Thin Films Developed by Thermal Evaporation Method

Abstract

The Zn1-xCdxS alloys were prepared in evacuated quartz tubes by the
method of melt quenching. The Zn1-xCdxS thin films prepared by thermal
evaporation method and at different value for x, (x= 0.0, 0.1, 0.2, 0.3, 0.4 and
0.5).
X-Ray diffraction technique was used to study the structure of this films
and the effect of x value on it . X-ray diffraction analysis confirmed that these
films are polycrystalline structure nature having f.c.c , and lattice parameters are
reported.
The most preferential orientation is along [111] direction for all deposited
films. The lattice parameter, grain size, microstrain, dislocation density in the
film are calculated and correlated with x.