Studying structural properties and dislocation density of SnO2 thin film by using the Modified Reiteveled Method

Abstract

In this research, we determine some of structural properties for example dislocation density, grain size, shape factor and texture coefficient by using Modified Reiteveled Method by analysis the spectrum of x-ray diffraction and this operation called line profile analysis, for thin film of SnO₂ were prepared by thermal chemical spray deposition technique at substrate temperature (250^oC), SnO₂ deposited on glass substrate are of polycrystalline nature. The results indicate that the dislocation density increase with increasing brooding the peak of the spectrum x-ray diffraction and this result of increasing coherent domain size and microstrain, but the grain size decreasing with increasing intensity and texture coefficient connect with intensity calculate experimentally and intensity of ASTM, where shape factor reach at maximum value at least of the brooding beak.